TY  - CONF

T1  - Super-resolution STEM imaging in the presence of specimen drift

JO  - ELECTRON MICROSCOPY AND ANALYSIS 1995

PY  - 1995/01/01

AU  - Colman CP

AU  - Rodenburg JM

ED  - Cherns D

VL  - 147

SP  - 107

EP  - 110

Y2  - 2024/09/19

ER  -