TY  - JOUR

T1  - Improvement in electron holographic phase images of focused-ion-beam-milled GaAs and Si p-n junctions by in situ annealing

JO  - Applied Physics Letters

PY  - 2006/02/06

AU  - Cooper D

AU  - Twitchett AC

AU  - Somodi PK

AU  - Midgley PA

AU  - Dunin-Borkowski RE

AU  - Farrer I

AU  - Ritchie DA

ED  - 

DO  - DOI: 10.1063/1.2172068

PB  - AIP Publishing

VL  - 88

IS  - 6

SP  - 063510

EP  - 063510

Y2  - 2024/09/20

ER  -