TY  - JOUR

T1  - XCT analysis of the influence of melt strategies on defect population in Ti–6Al–4V components manufactured by Selective Electron Beam Melting

JO  - Materials Characterization

PY  - 2015/04/01

AU  - Tammas-Williams S

AU  - Zhao H

AU  - Léonard F

AU  - Derguti F

AU  - Todd I

AU  - Prangnell PB

ED  - 

DO  - DOI: 10.1016/j.matchar.2015.02.008

PB  - Elsevier BV

VL  - 102

SP  - 47

EP  - 61

Y2  - 2024/09/20

ER  -