TY  - CONF

T1  - Backscattered SEM imaging of high-temperature samples for grain growth studies in metals

JO  - ELECTRON MICROSCOPY AND ANALYSIS 2003

PY  - 2004/01/01

AU  - Fielden IM

AU  - Cawley J

AU  - Rodenburg JM

ED  - McVitie S

ED  - McComb D

IS  - 179

SP  - 181

EP  - 184

Y2  - 2024/09/20

ER  -