TY  - CONF

T1  - Variable Temperature Scanning Hall Probe Microscopy (SHPM) Using Quartz Crystal AFM Feedback

JO  - INTERMAG 2006 - IEEE International Magnetics Conference

PY  - 2006/12/01

AU  - Dede M

AU  - Urkmen K

AU  - Oral A

AU  - Farrer I

AU  - Ritchie DA

ED  - 

DO  - DOI: 10.1109/intmag.2006.376308

PB  - IEEE

Y2  - 2024/09/20

ER  -