TY  - CONF

T1  - Ptychography applied to optical metrology

JO  - SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY

PY  - 2012/01/01

AU  - Claus D

AU  - Robinson DJ

AU  - Chetwynd DG

AU  - Shuo Y

AU  - Pike WT

AU  - Rodenburg JM

ED  - 

DO  - DOI: 10.1117/12.977959

VL  - 8413

Y2  - 2024/09/20

ER  -