TY  - JOUR

T1  - Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices

JO  - Physical Review B

UR  - http://eprints.whiterose.ac.uk/88069/

PY  - 2011/06/29

AU  - Scannell BC

AU  - Pilgrim I

AU  - See AM

AU  - Montgomery RD

AU  - Morse PK

AU  - Fairbanks MS

AU  - Marlow CA

AU  - Linke H

AU  - Farrer I

AU  - Ritchie DA

AU  - Hamilton AR et al

ED  - 

DO  - DOI: 10.1103/physrevb.85.195319

PB  - American Physical Society (APS)

VL  - 85

IS  - 19

Y2  - 2024/09/20

ER  -