TY  - JOUR

T1  - System identification-based frequency domain feature extraction for defect detection and characterization

JO  - NDT & E International

UR  - http://eprints.whiterose.ac.uk/130578/

PY  - 2018/04/19

AU  - Li P

AU  - Lang Z

AU  - Zhao L

AU  - Tian G

AU  - Neasham JA

AU  - Zhang J

AU  - Graham DJ

ED  - 

DO  - DOI: 10.1016/j.ndteint.2018.04.008

PB  - Elsevier

VL  - 98

SP  - 70

EP  - 79

Y2  - 2024/09/20

ER  -