TY  - JOUR

T1  - Noise limit on practical electron ptychography

JO  - Journal of Physics: Conference Series

PY  - 2010/01/01

AU  - Edo TB

AU  - Sweeney F

AU  - Lui C

AU  - Rodenburg JM

ED  - 

DO  - DOI: 10.1088/1742-6596/241/1/012065

VL  - 241

Y2  - 2024/09/20

ER  -