TY  - JOUR

T1  - Two-trap model for carrier lifetime and resistivity behavior in partially annealedGaAsgrown at low temperature

JO  - Physical Review B

PY  - 2006/01/01

AU  - Gregory IS

AU  - Tey CM

AU  - Cullis AG

AU  - Evans MJ

AU  - Beere HE

AU  - Farrer I

ED  - 

DO  - DOI: 10.1103/physrevb.73.195201

PB  - American Physical Society (APS)

VL  - 73

IS  - 19

Y2  - 2024/09/20

ER  -