TY  - CONF

T1  - On the Effect of SiC Power MOSFET Gate Oxide Degradation in High Frequency Phase Leg-Based Applications

CY  - Detroit, Michigan, USA

JO  - IEEE Energy Conversion Congress and Expo - ECCE 2022

PY  - 2022/10/09

AU  - Foster M

AU  - Naghibi J

AU  - Mohsenzade S

AU  - Iqbal S

AU  - Mehran K

ED  - 

PB  - IEEE

Y2  - 2024/09/19

ER  -