@inproceedings{inproceedings, title  = {{On the Effect of SiC Power MOSFET Gate Oxide Degradation in High Frequency Phase Leg-Based Applications}},

 publisher = {{IEEE}},

 url = {{}},

 year = {{2022}},

 month = {{10}},

 author = {{Foster M and Naghibi J and Mohsenzade S and Iqbal S and Mehran K}},

 journal = {{IEEE Energy Conversion Congress and Expo - ECCE 2022}},

 note = {{Accessed on 2024/09/19}}}