TY  - JOUR

T1  - Modeling the development of low current arcs and arc resistance simulation

JO  - IEEE Transactions on Dielectrics and Electrical Insulation

UR  - http://dx.doi.org/10.1109/tdei.2018.007100

PY  - 2018/12/01

AU  - Zhang X

AU  - Bruce A

AU  - Rowland S

AU  - Terzija V

AU  - Bu S

ED  - 

DO  - DOI: 10.1109/tdei.2018.007100

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 25

IS  - 6

SP  - 2049

EP  - 2057

Y2  - 2024/09/20

ER  -