TY  - JOUR

T1  - In the Field of Integrated Circuits Based on Machine Learning and Feature Matching Evaluation and Identification of Potential High-Value Patents

JO  - SSRN Electronic Journal

UR  - http://dx.doi.org/10.2139/ssrn.4084370

PY  - 2022/01/01

AU  - Hu Z

AU  - Zhou X

AU  - Lin A

ED  - 

DO  - DOI: 10.2139/ssrn.4084370

PB  - Elsevier BV

Y2  - 2024/09/19

ER  -