TY  - JOUR

T1  - Thermal near infrared monitoring system for electron beam melting with emissivity tracking

JO  - Additive Manufacturing

UR  - http://eprints.whiterose.ac.uk/132138/

PY  - 2018/08/01

AU  - Boone NA

AU  - Zhu C

AU  - Smith C

AU  - Todd I

AU  - Willmott J

ED  - 

DO  - DOI: 10.1016/j.addma.2018.06.004

PB  - Elsevier

VL  - 22

SP  - 601

EP  - 605

Y2  - 2024/09/20

ER  -