TY  - JOUR

T1  - Knowledge-Enhanced Spatiotemporal Analysis for Anomaly Detection in Process Manufacturing

JO  - Computers in Industry

UR  - http://dx.doi.org/10.1016/j.compind.2024.104111

PY  - 2024/10/01

AU  - Allen L

AU  - Lu H

AU  - Cordiner J

ED  - 

DO  - DOI: 10.1016/j.compind.2024.104111

PB  - Elsevier BV

VL  - 161

SP  - 104111

EP  - 104111

Y2  - 2024/09/20

ER  -