TY  - JOUR

T1  - Design of a Random Test Platform for DSP Serials Used in Embedded Systems

JO  - Advanced Materials Research

PY  - 2011/06/01

AU  - Wei CP

AU  - Li ZL

AU  - Liu H

AU  - Chen ZX

ED  - 

DO  - DOI: 10.4028/www.scientific.net/amr.267.98

PB  - Trans Tech Publications, Ltd.

VL  - 267

SP  - 98

EP  - 103

Y2  - 2024/09/19

ER  -