@article{article, title  = {{Design of a Random Test Platform for DSP Serials Used in Embedded Systems}},

 publisher = {{Trans Tech Publications, Ltd.}},

 url = {{}},

 year = {{2011}},

 month = {{6}},

 author = {{Wei CP and Li ZL and Liu H and Chen ZX}},

 doi = {{10.4028/www.scientific.net/amr.267.98}},

 volume = {{267}},

 journal = {{Advanced Materials Research}},

 pages = {{98-103}},

 note = {{Accessed on 2024/09/19}}}