TY  - CONF

T1  - Package-related degradation condition monitoring of SiC power MOSFETs using current distribution anomaly detection

JO  - 11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)

UR  - http://dx.doi.org/10.1049/icp.2022.1145

PY  - 2022/01/01

AU  - Naghibi J

AU  - Mohsenzade S

AU  - Mehran K

AU  - Foster MP

ED  - 

DO  - DOI: 10.1049/icp.2022.1145

PB  - Institution of Engineering and Technology

Y2  - 2024/09/19

ER  -